Invention Grant
- Patent Title: Method for performing measurements of dendritic structures for all magnifications and camera resolutions of microscopes
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Application No.: US16929238Application Date: 2020-07-15
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Publication No.: US11263510B2Publication Date: 2022-03-01
- Inventor: Adam P. Rabe
- Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Applicant Address: US MI Detroit
- Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Current Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Current Assignee Address: US MI Detroit
- Main IPC: G06M11/00
- IPC: G06M11/00 ; G06T7/00 ; G06T7/11

Abstract:
A system includes a processor and memory storing instructions that when executed by the processor configure the processor to receive an image of a metallographic sample of a product from a microscope, the image including dendritic structures in the metallographic sample; select a portion of the image; and perform morphological operations on the selected portion of the image to transform the image. The instructions configure the processor to overlay a plurality of concentric circles on the transformed image, measure circumferences of the circles, and count the number of intercepts of the circles and boundaries of the dendritic structures in the transformed image. The instructions configure the processor to determine parameters of the dendritic structures based on the measured circumferences and the number of intercepts. The instructions configure the processor to determine structural properties of the product based on the parameters of the dendritic structures.
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