Invention Grant
- Patent Title: Self-aligned source and drain contacts
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Application No.: US16918755Application Date: 2020-07-01
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Publication No.: US11264481B2Publication Date: 2022-03-01
- Inventor: Chanro Park , Kangguo Cheng , Ruilong Xie , Juntao Li
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Michael J. Chang, LLC
- Agent Randall Bluestone
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/285 ; H01L21/768 ; H01L23/532 ; H01L23/535 ; H01L29/45 ; H01L29/78

Abstract:
Self-aligned semiconductor FET device source and drain contacts and techniques for formation thereof are provided. In one aspect, a semiconductor FET device includes: at least one gate disposed on a substrate; source and drains on opposite sides of the at least one gate; gate spacers offsetting the at least one gate from the source and drains; lower source and drain contacts disposed on the source and drains; upper source and drain contacts disposed on the lower source and drain contacts; and a silicide present between the lower source and drain contacts and the upper source and drain contacts.
Public/Granted literature
- US20220005934A1 Self-Aligned Source and Drain Contacts Public/Granted day:2022-01-06
Information query
IPC分类: