- Patent Title: Method for measuring skin condition and electronic device therefor
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Application No.: US16335470Application Date: 2017-08-18
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Publication No.: US11266344B2Publication Date: 2022-03-08
- Inventor: Young-hyun Kim , Jeong-gun Lee , Shin-hee Cho , Moo-rim Kim , Jin-kyeong Kim , Min-sun Park , Seung-jun Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2016-0142110 20161028,KR10-2016-0165891 20161207
- International Application: PCT/KR2017/009012 WO 20170818
- International Announcement: WO2018/056584 WO 20180329
- Main IPC: A61B5/00
- IPC: A61B5/00

Abstract:
A method for measuring skin by an electronic device is provided. The method for measuring skin by the electronic device includes an operation of irradiating at least one light into skin to which a patch is adhered, an operation of detecting at least one reflected light on the basis of an amount of moisture in the skin, which is changed by physiologically active substances injected through the patch, corresponding to the irradiated light, an operation of generating patch adherence information indicating a skin adhesive state of the patch on the basis of the detection result of the at least one reflected light and an operation of providing the generated patch adherence information to an output unit or a communication unit.
Public/Granted literature
- US20210282703A1 METHOD FOR MEASURING SKIN CONDITION AND ELECTRONIC DEVICE THEREFOR Public/Granted day:2021-09-16
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