Invention Grant
- Patent Title: Spectrum analysis method and spectrum analysis apparatus
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Application No.: US16468908Application Date: 2018-05-25
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Publication No.: US11268857B2Publication Date: 2022-03-08
- Inventor: Tetsuya Nakamura , Naoki Tsuboi
- Applicant: TOYO CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOYO CORPORATION
- Current Assignee: TOYO CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- International Application: PCT/JP2018/020198 WO 20180525
- International Announcement: WO2019/225014 WO 20191128
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.
Public/Granted literature
- US20210325247A1 SPECTRUM ANALYSIS METHOD AND SPECTRUM ANALYSIS APPARATUS Public/Granted day:2021-10-21
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