Invention Grant
- Patent Title: Abnormality diagnostic method and abnormality diagnostic device for feed axis device
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Application No.: US17061736Application Date: 2020-10-02
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Publication No.: US11268884B2Publication Date: 2022-03-08
- Inventor: Mariko Ito , Takumi Hongo
- Applicant: OKUMA CORPORATION
- Applicant Address: JP Niwa-Gun
- Assignee: OKUMA CORPORATION
- Current Assignee: OKUMA CORPORATION
- Current Assignee Address: JP Niwa-Gun
- Agency: Burr & Brown, PLLC
- Priority: JPJP2019-202550 20191107
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G01M99/00

Abstract:
An abnormality diagnostic method for a feed axis device that diagnoses an abnormality of the feed axis device including a screw shaft and a nut, the feed axis device being incorporated in mechanical equipment, the abnormality diagnostic method includes controlling an operation of the feed axis device such that the screw shaft operates in a predetermined operating pattern, detecting a physical quantity signal generated from the feed axis device, and performing an abnormality diagnosis for the feed axis device based on the physical quantity signal detected by the detecting in accordance with a predetermined abnormality diagnosis algorithm. The performing includes performing a frequency analysis on the physical quantity signal to extract respective frequencies corresponding to a plurality of operating positions in the operating pattern and performing the abnormality diagnosis based on change of the frequencies corresponding to the respective operating positions.
Public/Granted literature
- US20210140853A1 ABNORMALITY DIAGNOSTIC METHOD AND ABNORMALITY DIAGNOSTIC DEVICE FOR FEED AXIS DEVICE Public/Granted day:2021-05-13
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