Invention Grant
- Patent Title: X-ray phase imaging system
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Application No.: US17287412Application Date: 2019-07-22
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Publication No.: US11268916B2Publication Date: 2022-03-08
- Inventor: Satoshi Sano , Koichi Tanabe , Yukihisa Wada , Satoshi Tokuda , Akira Horiba , Naoki Morimoto
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: JPJP2018-208933 20181106
- International Application: PCT/JP2019/028662 WO 20190722
- International Announcement: WO2020/095482 WO 20200514
- Main IPC: G01N23/041
- IPC: G01N23/041 ; A61B6/02 ; G01N23/046 ; A61B6/00

Abstract:
This X-ray phase imaging system (100) includes an X-ray source (1), a detector (2), a first grating group (3), a second grating group (4), a moving mechanism (5), and an image processing unit (6). The moving mechanism is configured to relatively move a subject (T) and the imaging system (9) such that the subject (T) passes through a first grating region (R1) and a second grating region (R2). The image processing unit is configured to generate a first phase-contrast image (14a) and a second phase-contrast image (14b).
Public/Granted literature
- US20210364453A1 X-RAY PHASE IMAGING SYSTEM Public/Granted day:2021-11-25
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