Invention Grant
- Patent Title: X-ray inspection apparatus
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Application No.: US17052527Application Date: 2018-05-21
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Publication No.: US11268917B2Publication Date: 2022-03-08
- Inventor: Yoshihiko Iwao
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- International Application: PCT/JP2018/019543 WO 20180521
- International Announcement: WO2019/224888 WO 20191128
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/046

Abstract:
Utilizing random variation (repeated positioning error) when reciprocating operation is repeatedly performed in which a stage is moved by (+x, +y) pulses toward an arbitrary position perpendicular to an optical axis of X-rays extending from an X-ray source to an X-ray detector, and then, is moved from there by (−x, −y) pulses, an image group of images obtained by moving in parallel to each other is acquired, and an image processing unit finds a deviation between the images, and acquires an input image group in which each of the images has the deviation at a subpixel level. The image processing unit executes a reconstruction processing, using the input image group in which each of the images has the deviation at the subpixel level to generate a super-resolution image.
Public/Granted literature
- US20210239626A1 X-RAY INSPECTION APPARATUS Public/Granted day:2021-08-05
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