Invention Grant
- Patent Title: Specimen analyzer and specimen analysis method
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Application No.: US15609626Application Date: 2017-05-31
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Publication No.: US11268969B2Publication Date: 2022-03-08
- Inventor: Seiji Takemoto , Takeshi Komoto , Hideki Hirayama , Takashi Yoshida , James Ausdenmoore
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Metrolex IP Law Group, PLLC
- Main IPC: G01N35/04
- IPC: G01N35/04 ; B01L3/00 ; G01N33/72 ; G01N35/00

Abstract:
The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information received by the input unit; and a controller which causes the analysis unit to be incapable of analyzing the specimen unless the input of the subject attribute information is performed with the input unit.
Public/Granted literature
- US20180348242A1 SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD Public/Granted day:2018-12-06
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