Techniques for diagnosing failures in a digital solenoid I/P converter are provided herein. A controller of the I/P converter may apply a fixed voltage to the I/P converter, causing an armature to move from an off-position to an on-position in a properly-functioning I/P converter. The controller may receive an indication of whether a digital logic line trip has occurred, indicating that a current for the I/P coil has reached a desired maximum current level, and an elapsed time from the application of the fixed voltage. The controller may compare the amount of time elapsed from the application of the fixed voltage to an expected amount of elapsed time from the application of the fixed voltage to the I/P coil after which a digital logic line trip will occur for a properly functioning I/P coil and diagnose, based on the comparison, a failure in the I/P converter.