Invention Grant
- Patent Title: Radiation measurement device
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Application No.: US17267646Application Date: 2018-08-17
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Publication No.: US11269085B2Publication Date: 2022-03-08
- Inventor: Hidetaka Yahata , Toshimitsu Nakai
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- International Application: PCT/JP2018/030504 WO 20180817
- International Announcement: WO2020/035937 WO 20200220
- Main IPC: G01R29/02
- IPC: G01R29/02 ; H03K21/02 ; G01T1/17

Abstract:
First and second pulse height detection circuits output pulse height detection signals which rise when a detection pulse obtained from a radiation detector becomes greater than a lower threshold Lsh or an upper threshold Hsh, and fall when the detection pulse is smaller than the lower threshold Lsh or the upper threshold Hsh. Next, first and second rising and falling detection circuits detect rising and falling edges of the pulse height detection signals from the first and second pulse height detection circuits in synchronization with a clock pulse from a crystal oscillator, and a combining circuit outputs a signal corresponding to the detection pulse that is within a range between the lower threshold Lsh and the upper threshold Hsh by combining both outputs from the first and second rising and falling detection circuits, in synchronization with the clock pulse.
Public/Granted literature
- US20210173099A1 RADIATION MEASUREMENT DEVICE Public/Granted day:2021-06-10
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