Invention Grant
- Patent Title: Diagnostic apparatus
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Application No.: US16882749Application Date: 2020-05-26
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Publication No.: US11269710B2Publication Date: 2022-03-08
- Inventor: Kazuhiro Satou
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Hauptman Ham, LLP
- Priority: JPJP2019-110298 20190613
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06N3/08

Abstract:
A diagnostic apparatus acquires data relating to a state of a machine, performs preprocessing on the acquired data, and modifies the preprocessed data by using a statistic relating to the state of the machine. Then, the diagnostic apparatus performs a process of machine learning by an auto encoder on the basis of the modified data and learns or diagnoses the state of the machine. Thus, this diagnostic apparatus provides a learning and inference method capable of uniformly handling a scale of data indicating a feature.
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