Invention Grant
- Patent Title: System and method for classification determination
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Application No.: US16728086Application Date: 2019-12-27
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Publication No.: US11270157B2Publication Date: 2022-03-08
- Inventor: Yanbo Chen , Yaozong Gao , Yiqiang Zhan
- Applicant: SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD.
- Current Assignee: SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Metis IP LLC
- Priority: CN201811630064.4 20181228
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/62

Abstract:
The present disclosure provides a system and method for classification determination of a structure. The method may include obtaining image data representing a structure of a subject. The method may also include determining a plurality of candidate classifications of the structure and their respective probabilities by inputting the image data into a classification model. The classification model may include a backbone network for determining a backbone feature of the structure, a segmentation network for determining a segmentation feature of the structure, and a density classification network for determining a density feature of the structure. The method may further include determining a target classification of the structure based on at least a part of the probabilities of the plurality of candidate classifications.
Public/Granted literature
- US20200210761A1 SYSTEM AND METHOD FOR CLASSIFICATION DETERMINATION Public/Granted day:2020-07-02
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