Invention Grant
- Patent Title: Solid-state imaging element, imaging device, and method for controlling solid-state imaging element
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Application No.: US16958929Application Date: 2018-09-18
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Publication No.: US11272128B2Publication Date: 2022-03-08
- Inventor: Masaki Sakakibara
- Applicant: Sony Semiconductor Solutions Corporation
- Applicant Address: JP Kanagawa
- Assignee: Sony Semiconductor Solutions Corporation
- Current Assignee: Sony Semiconductor Solutions Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Michael Best & Friedrich LLP
- Priority: JPJP2018-000715 20180105
- International Application: PCT/JP2018/034438 WO 20180918
- International Announcement: WO2019/135304 WO 20190711
- Main IPC: H04N5/361
- IPC: H04N5/361 ; H04N5/374 ; H04N5/378 ; H04N5/335 ; H04N5/345 ; H04N5/376 ; H04N5/369 ; H04N9/04 ; H01L27/146 ; H01L39/16 ; H04N5/3745

Abstract:
In a solid-state imaging element that detects a change in an amount of light on the basis of a photocurrent, erroneous detection due to a dark current or dark current shot noise is reduced.
The solid-state imaging element includes a limiting circuit, a differentiating circuit, and a comparison circuit. The limiting circuit limits an electric signal generated by photoelectric conversion by a predetermined limit value and outputs the electric signal limited as an output signal. The differentiating circuit obtains an amount of change of the output signal output from the limiting circuit. The comparison circuit performs comparison between the amount of change obtained by the differentiating circuit and a predetermined threshold value to output a result of the comparison as a result of detection of an address event.
The solid-state imaging element includes a limiting circuit, a differentiating circuit, and a comparison circuit. The limiting circuit limits an electric signal generated by photoelectric conversion by a predetermined limit value and outputs the electric signal limited as an output signal. The differentiating circuit obtains an amount of change of the output signal output from the limiting circuit. The comparison circuit performs comparison between the amount of change obtained by the differentiating circuit and a predetermined threshold value to output a result of the comparison as a result of detection of an address event.
Public/Granted literature
- US20200344432A1 SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND METHOD FOR CONTROLLING SOLID-STATE IMAGING ELEMENT Public/Granted day:2020-10-29
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