Invention Grant
- Patent Title: Millimeter wave reflection test apparatus
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Application No.: US17033589Application Date: 2020-09-25
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Publication No.: US11275035B2Publication Date: 2022-03-15
- Inventor: JeanMarc Laurent , Chinh Doan
- Applicant: MILLIWAVE SILICON SOLUTIONS, INC.
- Applicant Address: US CA San Jose
- Assignee: MILLIWAVE SILICON SOLUTIONS, INC.
- Current Assignee: MILLIWAVE SILICON SOLUTIONS, INC.
- Current Assignee Address: US CA San Jose
- Agency: Schwabe Williamson & Wyatt, P.C.
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01R27/32 ; G01N22/00 ; G01N21/59 ; G01N21/55 ; G01N21/3581 ; G01N22/04 ; G01N22/02 ; G01N35/00 ; G01F23/284 ; G01F1/40 ; G01F1/56 ; G01F1/74

Abstract:
Embodiments herein provide a test apparatus and system for a millimeter wave reflection test to measure propagation of millimeter wave signal through a material at various incident angles. In one example, the test apparatus may include a mechanized arch over a base plate, the mechanized arch including antenna carriers coupled to the mechanized arch and configured to hold respective antennas. A motor assembly moves the antenna carriers along the mechanized arch while maintaining the antenna carriers at symmetrical (equal and opposite) angles with respect to the base plate.
Public/Granted literature
- US20210096074A1 MILLIMETER WAVE REFLECTION TEST APPARATUS Public/Granted day:2021-04-01
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