Invention Grant
- Patent Title: Non-destructive testing methods and apparatus
-
Application No.: US16465957Application Date: 2017-12-11
-
Publication No.: US11275036B2Publication Date: 2022-03-15
- Inventor: Xiao Hu , Chenzhong Mu , Liying Zhang
- Applicant: Nanyang Technological University
- Applicant Address: SG Singapore
- Assignee: Nanyang Technological University
- Current Assignee: Nanyang Technological University
- Current Assignee Address: SG Singapore
- Priority: SG10201610348V 20161209
- International Application: PCT/SG2017/050610 WO 20171211
- International Announcement: WO2018/106194 WO 20180614
- Main IPC: G01N22/02
- IPC: G01N22/02

Abstract:
A non-destructive testing method of analyzing a sample comprising a composite material is disclosed. The method comprises: emitting an electromagnetic signal onto the sample, the electromagnetic signal having a range of frequencies; detecting a response signal transmitted and/or reflected by the sample in response to the electromagnetic signal; processing the response signal to determine variation with frequency of a dielectric permittivity of the sample over the range of frequencies; and determining an indication of a structural characteristic of the sample from a measure of the variation with frequency of the dielectric permittivity of the sample.
Public/Granted literature
- US20190317026A1 NON-DESTRUCTIVE TESTING METHODS AND APPARATUS Public/Granted day:2019-10-17
Information query