Disclosed is an inspection system having a background positioned adjacent an inspection zone; and an image capturing device configured to receive background electromagnetic radiation (EMR) from the background and from the inspection zone, the inspection zone being configured and arranged to receive material for transport into the inspection zone; wherein the background has a background property defined by a background emission, a background absorbance, and a background reflectance, the background property being matched in EMR to a material EMR of material to be transported into the inspection zone, the material having a material property defined by a material emission, a material absorbance, and a material reflectance; and wherein the image capturing device is configured to detect a foreign object within material when transported into the inspection zone by deducting the background EMR from the material EMR.