Invention Grant
- Patent Title: Display device and testing method for display panel
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Application No.: US16475783Application Date: 2017-08-10
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Publication No.: US11275108B2Publication Date: 2022-03-15
- Inventor: Wei Chen
- Applicant: HKC CORPORATION LIMITED , CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CO.,LTD.
- Applicant Address: CN Shenzhen; CN Chongqing
- Assignee: HKC CORPORATION LIMITED,CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CO.,LTD.
- Current Assignee: HKC CORPORATION LIMITED,CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CO.,LTD.
- Current Assignee Address: CN Shenzhen; CN Chongqing
- Agency: Wang Law Firm, Inc.
- Priority: CN201710233641.5 20170411
- International Application: PCT/CN2017/096864 WO 20170810
- International Announcement: WO2018/188238 WO 20181018
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G09G3/00 ; H04N17/00 ; G02F1/13
Abstract:
A display device and a testing method for a display panel are provided. The testing method for the display panel includes the steps of: storing an image signal for controlling the display panel to display a default image in a driver chip of the display panel, providing a power signal and a clock signal to the display panel, and retrieving the image signal and testing the display panel according to a preset test condition.
Information query
