Invention Grant
- Patent Title: Method of correcting measurement value of laser scanner, and device for the method
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Application No.: US16122054Application Date: 2018-09-05
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Publication No.: US11275154B2Publication Date: 2022-03-15
- Inventor: Ikuo Ishinabe , Taichi Yuasa
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Roberts Calderon Safran & Cole P.C.
- Priority: JPJP2017-182281 20170922
- Main IPC: G01S17/89
- IPC: G01S17/89 ; G01S7/497 ; G01S17/08 ; G01S7/48 ; G01S7/481

Abstract:
A method of correcting a measurement value of a laser scanner includes: in a laser scanner including a light emitting unit, a light receiving unit, a distance measuring unit, an optical axis deflecting unit having at least a pair of prisms deflecting a distance measuring light and a reflected distance measuring light, and an emitting direction detecting unit detecting a deflection angle and an emitting direction of the distance measuring light from the optical axis deflecting unit, (a) measuring a distance to a measurement point, (b) detecting rotation angles of the prisms, and (c) obtaining, based on rotation angles of the prisms, a true distance measurement value corrected for a length of an optical path length difference in light emission and/or light reception caused according to the rotation angles of the prisms by subtracting the optical path length difference from a distance measurement value of the distance measuring unit.
Public/Granted literature
- US20190094341A1 METHOD OF CORRECTING MEASUREMENT VALUE OF LASER SCANNER, AND DEVICE FOR THE METHOD Public/Granted day:2019-03-28
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