Invention Grant
- Patent Title: Analysis system
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Application No.: US17002965Application Date: 2020-08-26
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Publication No.: US11275665B2Publication Date: 2022-03-15
- Inventor: Yoichi Kawachiya , Masakazu Takahashi , Keiro Muro
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2019-226541 20191216
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/32 ; G06F11/34

Abstract:
A traceability estimation unit generates batch combination output data configured by a plurality of combinations of a batch in the first process and a batch in the second process, and the feature of the batch. The traceability estimation unit estimates the combination of the batch in the first process and the batch in the second process, which is used as traceability, from the plurality of the combinations of the batches in the batch combination output data by using the feature.
Public/Granted literature
- US20210182167A1 ANALYSIS SYSTEM Public/Granted day:2021-06-17
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