Invention Grant
- Patent Title: System and method for hybrid data reliability for object storage devices
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Application No.: US16165655Application Date: 2018-10-19
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Publication No.: US11275762B2Publication Date: 2022-03-15
- Inventor: Rekha Pitchumani , Yang Seok Ki
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G06F17/30
- IPC: G06F17/30 ; G06F3/06 ; G06F16/27 ; G06F11/14

Abstract:
Provided is a method of storing data in a key-value reliability system including N storage devices that are grouped into a reliability group as a single logical unit and that are managed by a virtual device management layer, N being an integer, the method including determining whether the data meets a threshold corresponding to a reliability mechanism for storing the data, selecting the reliability mechanism when the threshold is met, and storing the data according to the selected reliability mechanism.
Public/Granted literature
- US20190057140A1 SYSTEM AND METHOD FOR HYBRID DATA RELIABILITY FOR OBJECT STORAGE DEVICES Public/Granted day:2019-02-21
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