Invention Grant
- Patent Title: Surface defect identification method and apparatus
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Application No.: US16835908Application Date: 2020-03-31
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Publication No.: US11276162B2Publication Date: 2022-03-15
- Inventor: Thomas Chaton
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey, LLP
- Priority: EP19174221 20190513
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/70 ; G06N3/04 ; G06N3/08

Abstract:
Embodiments include a computer implemented method of processing images of material surfaces to identify defects on the imaged material surface, the method including training a neural network to generate reduced-defect versions of training images of material surfaces; acquiring an image of a subject material surface; inputting the acquired image to the neural network to generate a reduced-defect version of the acquired image; and comparing the reduced-defect version of the acquired image with the acquired image to identify differences. Defects on the subject material surface at locations of the identified differences are identifiable.
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