Invention Grant
- Patent Title: Integrated circuit and method for challenge-response physically unclonable function
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Application No.: US16567751Application Date: 2019-09-11
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Publication No.: US11277272B2Publication Date: 2022-03-15
- Inventor: Yunhyeok Choi , Yongki Lee , Yongsoo Kim , Jieun Park , Bohdan Karpinskyy
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2018-0136043 20181107,KR10-2019-0045135 20190417
- Main IPC: H04L9/00
- IPC: H04L9/00 ; H04L9/32 ; H04L9/08

Abstract:
Systems and methods are described based on an integrated circuit that performs a challenge-response physically unclonable function (PUF). The PUF is used for challenge-response authentication. The integrated circuit includes a PUP block configured to output an n-bit internal response corresponding to a challenge that requests a response where n is an integer greater than 1 and a response generator configured to calculate a Hamming weight of the internal response and output the response by comparing the Hamming weight with at least one reference.
Information query