Invention Grant
- Patent Title: Intra-prediction method for reducing intra-prediction errors and device for same
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Application No.: US16077830Application Date: 2017-02-16
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Publication No.: US11277615B2Publication Date: 2022-03-15
- Inventor: In-kwon Choi , Min-woo Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- International Application: PCT/KR2017/001718 WO 20170216
- International Announcement: WO2017/142327 WO 20170824
- Main IPC: H04N19/105
- IPC: H04N19/105 ; H04N19/132 ; H04N19/117 ; H04N19/159 ; H04N19/176

Abstract:
Provided is an image predicting method including: obtaining a plurality of adjacent samples located adjacent to a current block; determining an adjacent sample as a reference sample to be referred to by a current sample, the adjacent sample being from among the plurality of adjacent samples and being indicated by a direction of an intra mode of the current block; and adjusting a sample value of the reference sample according to a reference distance indicating a distance between the reference sample and the current sample, and determining a prediction value of the current sample based on the adjusted sample value of the reference sample.
Public/Granted literature
- US20210195199A1 INTRA-PREDICTION METHOD FOR REDUCING INTRA-PREDICTION ERRORS AND DEVICE FOR SAME Public/Granted day:2021-06-24
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