Invention Grant
- Patent Title: Device and method for analyzing a material
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Application No.: US15776544Application Date: 2016-12-07
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Publication No.: US11280728B2Publication Date: 2022-03-22
- Inventor: Alexander Bauer , Otto Hertzberg , Thorsten Lubinski
- Applicant: DiaMonTech GmbH
- Applicant Address: DE Berlin
- Assignee: DiaMonTech GmbH
- Current Assignee: DiaMonTech GmbH
- Current Assignee Address: DE Berlin
- Agency: Sunstein LLP
- Priority: WOPCT/DE2015/200532 20151209,DE102016214262.3 20160802,DE102016215580.6 20160819
- International Application: PCT/EP2016/080046 WO 20161207
- International Announcement: WO2017/097824 WO 20170615
- Main IPC: A61B5/145
- IPC: A61B5/145 ; G01N21/63 ; G01N21/3563 ; A61B5/1455 ; G01N21/17 ; G01N33/49 ; G01N21/552 ; A61B5/00 ; G01N21/55 ; G01N33/483 ; G01N33/66 ; G01N21/33

Abstract:
The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).
Public/Granted literature
- US20180328835A1 Device and Method for Analyzing a Material Public/Granted day:2018-11-15
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