Invention Grant
- Patent Title: Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor
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Application No.: US16495115Application Date: 2017-11-17
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Publication No.: US11280736B2Publication Date: 2022-03-22
- Inventor: Dug Young Kim , Won Sang Hwang , Dong Eun Kim , Min Gu Kang
- Applicant: YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF) , INTEKPLUS CO., LTD.
- Applicant Address: KR Seoul; KR Daejeon
- Assignee: YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF),INTEKPLUS CO., LTD.
- Current Assignee: YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF),INTEKPLUS CO., LTD.
- Current Assignee Address: KR Seoul; KR Daejeon
- Agency: NSIP Law
- Priority: KR10-2017-0042007 20170331
- International Application: PCT/KR2017/013142 WO 20171117
- International Announcement: WO2018/182125 WO 20181004
- Main IPC: G01N21/64
- IPC: G01N21/64 ; A61B5/00 ; G06T5/00

Abstract:
A fluorescence lifetime measuring apparatus according to an embodiment of the present invention includes: an irradiation light generator configured to generate irradiation light; a fluorescence photon detector configured to irradiate at least one or more samples, containing fluorescent molecules, with the irradiation light and collect a fluorescence photon generated by the irradiation; a converter configured to amplify the fluorescence photon and convert the amplified fluorescence photon into a fluorescence signal; and a measurer configured to analyze data of a function of the fluorescence signal by using a function obtained by multiplying a value, which is obtained by integrating the function of the fluorescence signal, by a simulation function.
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