Invention Grant
- Patent Title: Concentration measurement method and concentration measurement device
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Application No.: US16969214Application Date: 2019-01-17
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Publication No.: US11280776B2Publication Date: 2022-03-22
- Inventor: Tomonori Nakamura
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JPJP2018-025797 20180216
- International Application: PCT/JP2019/001345 WO 20190117
- International Announcement: WO2019/159597 WO 20190822
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N21/41 ; G02B27/30

Abstract:
A concentration measurement method for measuring a concentration of impurities includes a step of irradiating a DUT 10 serving as a measurement target object with measurement light and stimulus light subjected to intensity modulation using a modulation signal including a default frequency, a step of outputting a detection signal by detecting an intensity of reflected light from the DUT 10 or transmitted light through the DUT 10, and a step of detecting a phase delay of the detection signal with respect to the modulation signal, obtaining a frequency at which the phase delay has a predetermined value, and estimating a concentration of impurities in the measurement target object on the basis of the frequency.
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