Invention Grant
- Patent Title: Detecting anomalies in a plurality of showcases
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Application No.: US16380378Application Date: 2019-04-10
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Publication No.: US11280816B2Publication Date: 2022-03-22
- Inventor: Masanao Natsumeda , Wei Cheng , Haifeng Chen
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph Kolodka
- Main IPC: G01R21/133
- IPC: G01R21/133

Abstract:
Systems and methods for detecting anomalies in a plurality of showcases are provided. A system can obtain a corresponding table between each of the plurality of showcases and at least one corresponding sensor. The system obtains information for showcase clustering. The system can include a processor device that can determine at least one cluster of showcases based on the information for showcase clustering and the corresponding table between each of the plurality of showcases and the at least one corresponding sensor. The system can build at least one model for each of the at least one cluster of showcases and detect at least one anomaly based on data from the at least one cluster of showcases and the at least one model.
Public/Granted literature
- US20190324068A1 DETECTING ANOMALIES IN A PLURALITY OF SHOWCASES Public/Granted day:2019-10-24
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