- Patent Title: Testing device and testing method for testing a device under test
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Application No.: US16240180Application Date: 2019-01-04
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Publication No.: US11280833B2Publication Date: 2022-03-22
- Inventor: Stefan Schmidt
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Ditthavong, Steiner & Mlotkowski
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G01R31/317 ; H04B17/00 ; H03M1/06 ; G10L19/02 ; H04L27/20 ; G10L19/005 ; H04L27/00 ; G06F1/03 ; G01R31/28 ; G10L21/0208 ; H03M1/10 ; G10L19/26 ; H04L27/36 ; H04L27/16 ; G01R31/3167

Abstract:
A testing device and a method for testing a device under test are provided. The testing device comprises at least two signal generators, at least two numerically controlled oscillators, at least two white gaussian noise generators, at least two digital filters, each of which comprising a respective transfer function Hi, at least two adders, at least two digital-to-analog converters, and an analog processor.
Public/Granted literature
- US20200217891A1 TESTING DEVICE AND TESTING METHOD FOR TESTING A DEVICE UNDER TEST Public/Granted day:2020-07-09
Information query
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