Invention Grant
- Patent Title: Apparatus for adjusting parameter related to defect detection for image processing for image processing, method for information processing, and program
-
Application No.: US16801031Application Date: 2020-02-25
-
Publication No.: US11281924B2Publication Date: 2022-03-22
- Inventor: Kei Takayama , Yusuke Mitarai , Atsushi Nogami , Shoichi Hoshino
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. IP Division
- Priority: JPJP2019-037870 20190301
- Main IPC: G06K9/03
- IPC: G06K9/03 ; G06K9/00 ; G06K9/50 ; G06K9/20 ; G06K9/62 ; G06T7/00

Abstract:
An apparatus includes a display control unit, a receiving unit, an adjusting unit, and a determination unit. The display control unit is configured to display an image showing a result of detection of a defect from a captured image of a structure on a display device. The receiving unit is configured to receive an operation to specify part of the displayed image as a first region and an operation to give an instruction to correct at least part of the detection data corresponding to the first region. The adjusting unit is configured to adjust a parameter to be applied to the first region according to the instruction. The determination unit is configured to determine one or more second regions to which the adjusted parameter is to be applied from a plurality of segmented regions of the image.
Public/Granted literature
Information query