Invention Grant
- Patent Title: Semiconductor structure and manufacturing method thereof
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Application No.: US16512216Application Date: 2019-07-15
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Publication No.: US11282941B2Publication Date: 2022-03-22
- Inventor: Shiang-Bau Wang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/51 ; H01L21/265 ; H01L21/3213 ; H01L29/78 ; H01L29/165 ; H01L29/49

Abstract:
A method of manufacturing a semiconductor device includes: forming a gate over a semiconductor substrate; forming doped regions in the semiconductor substrate on both sides of the gate; depositing a dielectric layer on sidewalls of the gate; depositing a spacer laterally surrounding the dielectric layer, the spacer including a carbon-free portion and a carbon-containing portion laterally surrounding the carbon-free portion; removing the gate and vertical portions of the dielectric layer to form a recess; and filling a conductive layer in the recess.
Public/Granted literature
- US20190341470A1 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF Public/Granted day:2019-11-07
Information query
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