Invention Grant
- Patent Title: Texture analyzer
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Application No.: US16715336Application Date: 2019-12-16
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Publication No.: US11293743B2Publication Date: 2022-04-05
- Inventor: Alex Mak , Arief Raja , Charles Falzarano , Shali Avidzba , Kerri Topham
- Applicant: AMETEK, INC.
- Applicant Address: US PA Berwyn
- Assignee: AMETEK, INC.
- Current Assignee: AMETEK, INC.
- Current Assignee Address: US PA Berwyn
- Agency: RatnerPrestia
- Main IPC: G01B5/28
- IPC: G01B5/28

Abstract:
A texture analyzer having a support structure including a base plate, a carriage support, and a moveable carriage that receives a load cell module; a fixture to receive a sample between the base plate and the load cell module; a memory storing support structure and load cell module deflection parameters; and a processor. The processor is configured to identify the load cell module, retrieve the support structure deflection parameters and one of multiple load cell module deflection parameters, obtain raw measurement signals from the load cell module, and refine the raw measurement signals to compensate for deflection in the load cell module using the retrieved load cell module deflection parameters and support structure deflection parameters.
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