Invention Grant
- Patent Title: Equipment inspection system, equipment inspection method, and program
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Application No.: US16680735Application Date: 2019-11-12
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Publication No.: US11293836B2Publication Date: 2022-04-05
- Inventor: Shun Sato
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Applicant Address: JP Toyota
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2019-000747 20190107
- Main IPC: G01M13/00
- IPC: G01M13/00

Abstract:
An equipment inspection system capable of creating an inspection plan for inspecting a component part of an equipment at an appropriate timing is provided. An equipment inspection system includes an index acquisition unit, an importance level judgement unit, and an inspection time determination unit. The index acquisition unit acquires at least one influence index. The importance level judgement unit judges an importance level of an inspection on a component part based on the influence index. The inspection time determination unit determines the inspection time of the component part according to the importance level.
Public/Granted literature
- US20200217751A1 EQUIPMENT INSPECTION SYSTEM, EQUIPMENT INSPECTION METHOD, AND PROGRAM Public/Granted day:2020-07-09
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