Invention Grant
- Patent Title: Image inspection system and image inspection method
-
Application No.: US16797128Application Date: 2020-02-21
-
Publication No.: US11295434B2Publication Date: 2022-04-05
- Inventor: Tsuyoshi Yamagami
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JPJP2019-072959 20190405
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N5/225

Abstract:
Both improvement of a degree of freedom in selecting the model of the imaging device and improvement in accuracy of the image inspection are achieved by causing an imaging device conformable to a standardization standard to perform multi-stage processing in order. A setting device specifies a combination of values of a plurality of selectors for realizing multi-stage processing set by a user on a user interface, and transmits the values of the selectors and register information to the imaging device. The imaging device stores the values of the selectors in a location indicated by the corresponding register information, and sequentially executes the multi-stage processing specified by the combination of the values of the selectors.
Public/Granted literature
- US20200320680A1 Image Inspection System And Image Inspection Method Public/Granted day:2020-10-08
Information query