Invention Grant
- Patent Title: Sample holder for electron microscopy
-
Application No.: US16944908Application Date: 2020-07-31
-
Publication No.: US11295929B2Publication Date: 2022-04-05
- Inventor: Alpesh Khushalchand Shukla
- Applicant: ZoNexus LLC
- Applicant Address: US CA Pinole
- Assignee: ZoNexus LLC
- Current Assignee: ZoNexus LLC
- Current Assignee Address: US CA Pinole
- Agency: Intellent Patents LLC
- Agent Ahmed Alhafidh
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/26

Abstract:
A sample holder tip for use in transmission electron microscopy (TEM) or scanning electron microscopy (SEM) for performing in-situ experiments is described which facilitates in situ analysis of air-sensitive samples and allows physical manipulation of the sample. This includes, but is not limited to translation, rotation, electrical biasing, and heating/cooling for one or more individual cradles. The sample holder tip incorporates a compact design which eases sample loading and enables direct linkages between consecutive cradles, allowing a single tilt actuator to rotate each cradle around its respective eucentric position. Each of the connecting wires incorporates one or more bends or kinks which enable conductive access to the sample holder tip while also preserving the ability to also retract/extend the tip and tilt individual cradles with at least two degrees of freedom.
Public/Granted literature
- US20210350998A1 SAMPLE HOLDER FOR ELECTRON MICROSCOPY Public/Granted day:2021-11-11
Information query