Invention Grant
- Patent Title: Interconnection structure and sensor package
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Application No.: US16514962Application Date: 2019-07-17
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Publication No.: US11296025B2Publication Date: 2022-04-05
- Inventor: Hsun-Wei Chan , Shih-Chieh Tang
- Applicant: Advanced Semiconductor Engineering, Inc.
- Applicant Address: TW Kaohsiung
- Assignee: Advanced Semiconductor Engineering, Inc.
- Current Assignee: Advanced Semiconductor Engineering, Inc.
- Current Assignee Address: TW Kaohsiung
- Agency: Foley & Lardner LLP
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H05K1/18

Abstract:
A sensor package includes a carrier, a sensor, an interconnection structure, a conductor and a housing. The sensor is disposed on the carrier. The interconnection structure is disposed on the carrier and surrounds the sensor. The interconnection structure has a first surface facing away from the carrier. The conductor is disposed on the first carrier. The conductor having a first portion covered by the interconnection structure and a second portion exposed from the first surface of the interconnection structure. The housing is disposed on the carrier and surrounds the interconnection structure.
Public/Granted literature
- US20200027834A1 INTERCONNECTION STRUCTURE AND SENSOR PACKAGE Public/Granted day:2020-01-23
Information query
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