Invention Grant
- Patent Title: Multi-head measuring apparatus and measuring point automatic allocation method thereof
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Application No.: US16461389Application Date: 2018-12-25
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Publication No.: US11300401B2Publication Date: 2022-04-12
- Inventor: Min Li , Zhiwei Yu , Min Qiu
- Applicant: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Hubei
- Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Hubei
- Agent Mark M. Friedman
- Priority: CN201711450322.6 20171227
- International Application: PCT/CN2018/123453 WO 20181225
- International Announcement: WO2019/128981 WO 20190704
- Main IPC: G01B11/06
- IPC: G01B11/06 ; G02F1/13 ; G01B21/08 ; G01B21/04

Abstract:
A measuring point position automatic allocation method for a multi-head measuring apparatus is provided and includes steps as follows: obtaining point position coordinates for all point positions on a surface of a color filter that need measurement, grouping the point position coordinates, matching the Y-axis coordinates of each group with gantry mechanisms corresponding to a measuring range, according to the Y-axis coordinates of the gantry mechanisms matching X-axis coordinates with the measuring head mechanisms, sequentially matching the point position coordinates of all the point positions needing measurement with the gantry mechanisms and the measuring head mechanisms to complete allocation of the point positions.
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