Invention Grant
- Patent Title: Analysis apparatus, analysis method and analysis program
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Application No.: US16074967Application Date: 2017-02-15
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Publication No.: US11300529B2Publication Date: 2022-04-12
- Inventor: Atsushi Ohbuchi , Takayuki Konya , Go Fujinawa , Akihiro Himeda
- Applicant: Rigaku Corporation
- Applicant Address: JP Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JPJP2016-027965 20160217
- International Application: PCT/JP2017/005543 WO 20170215
- International Announcement: WO2017/141973 WO 20170824
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01N23/20 ; G01N23/223

Abstract:
An analysis apparatus, an analysis method, and an analysis program by which even unskilled ones can perform quantitative analysis of a composition of high-performance cement with high precision. An analysis apparatus 100 for performing quantitative analysis of components of cement, includes: a content percentage conversion unit 120 for converting content percentages of major elements of a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; a scale factor estimation unit 140 for estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained in the conversion; and a Rietveld analysis unit 150 for performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the initial values of scale factors previously been estimated to calculate content percentages of respective phases of the cement sample.
Public/Granted literature
- US20190041342A1 ANALYSIS APPARATUS, ANALYSIS METHOD AND ANALYSIS PROGRAM Public/Granted day:2019-02-07
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