Invention Grant
- Patent Title: Analysis device and analysis method
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Application No.: US15938415Application Date: 2018-03-28
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Publication No.: US11300580B2Publication Date: 2022-04-12
- Inventor: Shigehiko Iwama , Makoto Itonaga , Yuichi Hasegawa , Koji Tsujita , Masayuki Ono , Makoto Igarashi
- Applicant: JVC KENWOOD CORPORATION
- Applicant Address: JP Yokohama
- Assignee: JVC KENWOOD CORPORATION
- Current Assignee: JVC KENWOOD CORPORATION
- Current Assignee Address: JP Yokohama
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- Priority: JPJP2015-193868 20150930
- Main IPC: G01N33/558
- IPC: G01N33/558 ; G01N35/04 ; G01N37/00 ; G01N33/543 ; G01N21/01 ; G01N35/00 ; G01N21/62 ; G01D5/347 ; G01N21/55

Abstract:
An analysis device includes a turntable holding a substrate, an optical pickup driven in a direction perpendicular to a rotation axis of the turntable and configured to emit laser light to reaction regions and to receive reflected light from the respective reaction regions, an optical pickup drive circuit, and a controller. The reaction regions are formed at positions different from the center of the substrate. The center of the substrate is located on the rotation axis of the turntable. The optical pickup detects a reception level of the reflected light to generate a light reception level signal. The controller controls a turntable drive circuit to rotate the substrate, controls the optical pickup drive circuit to drive the optical pickup, and specifies the respective reaction regions in accordance with a positional information signal and the light reception level signal.
Public/Granted literature
- US20180217175A1 ANALYSIS DEVICE AND ANALYSIS METHOD Public/Granted day:2018-08-02
Information query
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