Invention Grant
- Patent Title: Ground fault interrupter self test circuits and related methods
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Application No.: US16458368Application Date: 2019-07-01
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Publication No.: US11300617B2Publication Date: 2022-04-12
- Inventor: Bruce G. Armstrong , Rishi Pratap Singh , Sanath Kumar Kondur Surya Kumar , Riley Beck
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Adam R. Stephenson, Ltd.
- Main IPC: G01R31/14
- IPC: G01R31/14 ; G01R31/327 ; G01R31/28 ; H02H3/33 ; G01R31/52 ; G01R31/40 ; G01R31/42 ; G01R27/18 ; G01R31/00 ; G01R31/08 ; H02H3/16

Abstract:
Implementations of ground fault circuit interrupter (GFCI) self-test circuits may include: a current transformer coupled to a controller, a silicon controlled rectifier (SCR) test loop coupled to the controller, a ground fault test loop coupled to the controller, and a solenoid coupled to the controller. The SCR test loop may be configured to conduct an SCR self-test during a first half wave portion of a phase and the ground fault test loop may be configured to conduct a ground fault self-test during a second half wave portion of a phase. An SCR may be configured to activate the solenoid to deny power to a load upon one of the SCR self-test or the ground fault self-test being identified as failing.
Public/Granted literature
- US20200041567A1 GROUND FAULT INTERRUPTER SELF TEST CIRCUITS AND RELATED METHODS Public/Granted day:2020-02-06
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