Invention Grant
- Patent Title: Method of controlling repair of volatile memory device and storage device performing the same
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Application No.: US16790256Application Date: 2020-02-13
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Publication No.: US11301317B2Publication Date: 2022-04-12
- Inventor: Dong Kim , Inhoon Park , Jangseon Park , Hyunglae Eun
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2019-0088724 20190723
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F11/10

Abstract:
A method of controlling repair of a volatile memory device, includes, performing a patrol read operation repeatedly to provide error position information of errors included in read data from a volatile memory device, generating accumulated error information by accumulating the error position information based on the patrol read operation performed repeatedly, determining error attribute based on the accumulated error information, the error attribute indicating correlation between the errors and a structure of the volatile memory device, and performing a runtime repair operation with respect to the volatile memory device based on the accumulated error information and the error attribute. The errors may be managed efficiently to prevent failure of the volatile memory device, and thus performance and lifetime of the volatile memory device and the storage device may be enhanced.
Public/Granted literature
- US20210026728A1 METHOD OF CONTROLLING REPAIR OF VOLATILE MEMORY DEVICE AND STORAGE DEVICE PERFORMING THE SAME Public/Granted day:2021-01-28
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