Invention Grant
- Patent Title: Inspection support system, learning device, and determination device
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Application No.: US16825230Application Date: 2020-03-20
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Publication No.: US11301976B2Publication Date: 2022-04-12
- Inventor: Kazuya Furuichi , Akihito Ikarashi , Shizuka Ikawa , Kenichi Mimura
- Applicant: CHIYODA CORPORATION
- Applicant Address: JP Yokohama
- Assignee: CHIYODA CORPORATION
- Current Assignee: CHIYODA CORPORATION
- Current Assignee Address: JP Yokohama
- Agency: Cantor Colburn LLP
- Priority: JPJP2017-223312 20171121
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/00 ; G06K9/62 ; G06N3/08

Abstract:
An inspection support system comprising: determination devices that determine pass or fail based on a result of non-destructive inspection of the object; and a learning device that learns a determination algorithm used to determine pass or fail based on information collected from the determination devices. The determination device transmits an ultimate determination result yielded by an inspection person who has checked a determination result to the learning device along with the corresponding result of non-destructive inspection of the object. The learning device includes: a determination result reception unit that receives the ultimate determination result and the result of non-destructive inspection of the inspection object; a learning unit that learns the determination algorithm based on received information; and a provision unit that provides the learned determination algorithm to the determination devices.
Public/Granted literature
- US20200234425A1 INSPECTION SUPPORT SYSTEM, LEARNING DEVICE, AND DETERMINATION DEVICE Public/Granted day:2020-07-23
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