Invention Grant
- Patent Title: Three-dimensional map generation with metadata overlay for visualizing projected workflow impact in computing environment
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Application No.: US16592436Application Date: 2019-10-03
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Publication No.: US11302078B2Publication Date: 2022-04-12
- Inventor: Nicole Reineke , Valerie Charry
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agency: Ryan, Mason & Lewis, LLP
- Main IPC: G06T19/00
- IPC: G06T19/00

Abstract:
In a computing environment comprising a plurality of equipment racks wherein each equipment rack comprises one or more of compute, storage and network assets, a method identifies a workflow attributed to at least a portion of the assets in at least one equipment rack of the computing environment, generates one or more overlays that visualize a projected impact to one or more components of the identified workflow, obtains a three-dimensional representation of the at least one equipment rack, and superimposes the one or more overlays on the three-dimensional representation of the at least one equipment rack.
Public/Granted literature
Information query