Invention Grant
- Patent Title: Inspection support device, endoscope device, inspection support method, and inspection support program
-
Application No.: US16842761Application Date: 2020-04-08
-
Publication No.: US11302092B2Publication Date: 2022-04-12
- Inventor: Shinji Hayashi , Masaaki Oosake
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: JCIPRNET
- Priority: JPJP2017-210379 20171031
- Main IPC: A61B1/00
- IPC: A61B1/00 ; G06V10/22 ; A61B1/045 ; G06T7/00

Abstract:
The system control unit functions as a captured image data acquisition unit that acquires captured image data obtained by imaging the inside of a subject with an endoscope; a visual-line detection unit 44B that detects a visual line directed to a display device that displays a captured image based on the captured image data; a processing unit that performs recognition processing for performing detection of a lesion site from the captured image data and identification of the detected lesion site on the captured image data; and a display control unit for causing the display device to display a result of the recognition processing by the processing unit. The processing unit controls the content of the recognition processing on the captured image data on the basis of the visual line detected by the visual-line detection unit.
Public/Granted literature
- US20200234070A1 INSPECTION SUPPORT DEVICE, ENDOSCOPE DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTION SUPPORT PROGRAM Public/Granted day:2020-07-23
Information query