Invention Grant
- Patent Title: Dual laser closure scan and method of using the same
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Application No.: US16225812Application Date: 2018-12-19
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Publication No.: US11305975B2Publication Date: 2022-04-19
- Inventor: Thomas C. Schafer
- Applicant: Silgan White Cap LLC
- Applicant Address: US IL Downers Grove
- Assignee: Silgan White Cap LLC
- Current Assignee: Silgan White Cap LLC
- Current Assignee Address: US IL Downers Grove
- Agency: Reinhart Boerner Van Deuren s.c.
- Main IPC: B67B3/00
- IPC: B67B3/00 ; B67B3/26 ; G01N21/90 ; B65G43/08 ; B65G15/50 ; B07C5/34

Abstract:
A system of measuring a top surface of a closure to determine if the closure is properly affixed to a container. Multiple paths of measurements may be collected and analyzed. In various analysis paradigms, measurements on a given path are separated into different sets, such as a leading set that generally includes the first third of measurements, a trailing set that includes the trailing set of measurements, and a middle set that includes the middle third of measurements. Several methods of analysis may be based on a presumption that a properly affixed closure is symmetrical or near symmetrical.
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