Invention Grant
- Patent Title: System and method for interpretation and analysis of manufacturing activity
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Application No.: US16121417Application Date: 2018-09-04
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Publication No.: US11307117B2Publication Date: 2022-04-19
- Inventor: Akshat Thirani , Philip House
- Applicant: Amper Technologies, Inc.
- Applicant Address: US IL Chicago
- Assignee: Amper Technologies, Inc.
- Current Assignee: Amper Technologies, Inc.
- Current Assignee Address: US IL Chicago
- Agency: Alpine Patents LLC
- Agent Brian Van Osdol
- Main IPC: G01M99/00
- IPC: G01M99/00 ; G05B23/02 ; G07C3/00 ; G06Q10/00 ; G05B19/406 ; G01R19/25 ; G01R21/133

Abstract:
A system and method for monitoring manufacturing machines that includes a sensor system that monitors a plurality of machines, wherein the sensor system is comprised of a set of current transformers, and wherein the set of current transformers transform electric currents to the plurality of machines into electric signals; an activity processing engine, wherein the activity processing engine generates diagnostic metrics from the electric signals for each machine from the plurality of machines; and a management platform configured to provide access to diagnostic metrics of the plurality of machines.
Public/Granted literature
- US20190072461A1 SYSTEM AND METHOD FOR INTERPRETATION AND ANALYSIS OF MANUFACTURING ACTIVITY Public/Granted day:2019-03-07
Information query