Invention Grant
- Patent Title: Quality detection device, quality detection method, and integrated probe assembly
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Application No.: US16854917Application Date: 2020-04-22
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Publication No.: US11307160B2Publication Date: 2022-04-19
- Inventor: Sheng Lin Wang , Hao Liu , Da Chang Hu , Yong Hu , Peng Fei Lei , Ji Guo Liu , Zuo Bin Xu , Yun Feng Gao
- Applicant: HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD
- Applicant Address: CN Shenzhen
- Assignee: HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD
- Current Assignee: HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD
- Current Assignee Address: CN Shenzhen
- Main IPC: G01N27/20
- IPC: G01N27/20 ; G01N33/207 ; G01N27/04

Abstract:
The present disclosure relates to a welding quality detecting field, and specifically relates to a quality detection device. The quality detection device includes an integrated probe set, a driving module and a collecting module. The integrated probe set includes a plurality of integrated probe assemblies. The integrated probe assemblies are disposed in pairs and each integrated probe assembly includes a driving end and a collecting end. The driving end of one integrated probe assembly is matched with the driving end of another integrated probe assembly disposed in pairs with the one integrated probe assembly. The collecting end of one integrated probe assembly is matched with the collecting end of another integrated probe assembly disposed in pairs with the one integrated probe assembly.
Public/Granted literature
- US20200249189A1 QUALITY DETECTION DEVICE, QUALITY DETECTION METHOD, AND INTEGRATED PROBE ASSEMBLY Public/Granted day:2020-08-06
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