A contacting unit (30) for a test handler (100) for carrying out functional tests on semiconductor elements having a surface, in particular on ICs (200), has a contacting module (60). The contacting module (60) comprises an inlet (61) through which a semiconductor element (200) to be tested is introduced into the contacting module (60), a test chamber (62) in which the semiconductor element (200) to be tested is fixed in a test position and subjected to the functional test, a movably arranged plunger (63) for fixing the semiconductor element to be tested in the test position, a first temperature sensor (64) arranged on the plunger (63) for measuring the surface temperature at the surface of the semiconductor element (200) to be tested, an air supply (65) for introducing a temperature control current into the test chamber (62), a controller for setting the temperature of the temperature control current depending on the surface temperature, at least one flushing chamber (70a, 70b, 70c) for flushing the test chamber (62), the first temperature sensor (64) or the air supply (65) with flushing air, and an outlet (66) through which the semiconductor element (200) is guided out of the contacting module (60) after the functional test. Furthermore, there is an air curtain at the inlet and outlet. In a method for controlling the contacting unit (30), the temperature of the temperature control current is controlled depending on the surface temperature.