Invention Grant
- Patent Title: Analysis apparatus, analysis method, and storage medium
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Application No.: US17000408Application Date: 2020-08-24
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Publication No.: US11308082B2Publication Date: 2022-04-19
- Inventor: Kento Ikkaku , Kazuhito Matsuda , Norinao Kouma
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JPJP2019-158342 20190830
- Main IPC: G06F16/245
- IPC: G06F16/245

Abstract:
An analysis method includes acquiring target data collected at edges; determining first analysis target satisfying a first condition, and specifying a first detection position indicating a position at which the first analysis target is detected at the edges and a first detection time; calculating a correlation coefficient of the feature amount; specifying a first range of the first detection position and a second range of the first detection time of the analysis target for which the correlation coefficient satisfies a predetermined relationship; determining second analysis target satisfying a second condition, and specifying a second detection position and a second detection time; determining whether the analysis target in which the second detection position is included in the first range and the second detection time; and acquiring any one of the analysis target from the edges when it is determined that the analysis target is included.
Public/Granted literature
- US20210064606A1 ANALYSIS APPARATUS, ANALYSIS METHOD, AND STORAGE MEDIUM Public/Granted day:2021-03-04
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