Invention Grant
- Patent Title: Neural network layer-by-layer debugging
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Application No.: US16455329Application Date: 2019-06-27
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Publication No.: US11308396B2Publication Date: 2022-04-19
- Inventor: Jindrich Zejda , Jeffrey T. Huynh , Drazen Borkovic , Se jong Oh , Ron Diamant , Randy Renfu Huang
- Applicant: Amazon Technologies, Inc.
- Applicant Address: US WA Seattle
- Assignee: Amazon Technologies, Inc.
- Current Assignee: Amazon Technologies, Inc.
- Current Assignee Address: US WA Seattle
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G06F9/38

Abstract:
Techniques are disclosed for debugging a neural network execution on a target processor. A reference processor may generate a plurality of first reference tensors for the neural network. The neural network may be repeatedly reduced to produce a plurality of lengths. For each of the lengths, a compiler converts the neural network into first machine instructions, the target processor executes the first machine instructions to generate a first device tensor, and the debugger program determines whether the first device tensor matches a first reference tensor. A shortest length is identified for which the first device tensor does not match the first reference tensor. Tensor output is enabled for a lower-level intermediate representation of the shortest neural network, and the neural network is converted into second machine instructions, which are executed by the target processor to generate a second device tensor.
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