Invention Grant
- Patent Title: Apparatus and method for system profile learning in an information handling system
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Application No.: US15594012Application Date: 2017-05-12
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Publication No.: US11308417B2Publication Date: 2022-04-19
- Inventor: Nikhil M. Vichare , Yan Ning
- Applicant: DELL PRODUCTS, LP
- Applicant Address: US TX Round Rock
- Assignee: DELL PRODUCTS, LP
- Current Assignee: DELL PRODUCTS, LP
- Current Assignee Address: US TX Round Rock
- Agency: Larson Newman, LLP
- Main IPC: G06N7/00
- IPC: G06N7/00 ; G06N20/00 ; G06F11/30 ; G06F11/00 ; G06F11/34 ; G06F11/07 ; G06N5/04

Abstract:
An information handling system includes a processing system including a first sensor, and a second sensor, and a management system including an anomaly table, a learned model table entry associated with the processing system and including a learned model and a first sensor data history, and a prediction module to implement a prediction algorithm. The management system is configured to: receive first sensor data and second sensor data, determine an estimate of a first value of the first sensor data using a second value of the second sensor data, determine a residual of the first value by a comparison of the estimate to the first value, determine a significance of the residual, where the significance having a significant value is associated with a predicted anomaly, determine that an anomaly table entry has a known anomaly class for the predicted anomaly, and perform a remediation plan to resolve the predicted anomaly.
Public/Granted literature
- US20170249565A1 Apparatus and Method for System Profile Learning in an Information Handling System Public/Granted day:2017-08-31
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06N | 基于特定计算模型的计算机系统 |
G06N7/00 | 基于特定数学模式的计算机系统 |